0000007005 00000 n New technologies consistently come with new fail mechanisms, such that advanced silicon debug and efficient yield learning during process and device ramp become an integral necessity in the race to market. The Advantest bridge beams are specifically designed to match all application areas, featuring cut outs to provide the required instrument space, so that the new front-end modules can access the DUT interface board / probe card. (-{Q&.v1xRYdI~.4 nd|7I:aN!OM . To significantly speed up test program development and with this reduce the time to market the V93000 provides a comprehensive ready to use demodulation library which covers all major standards and which is continuously extended. The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. All features and performance points are available in all classes. 0000168589 00000 n V93000 - Advantest Contact Information V93000 Service and support information to maximize the use of our products. . Now, multiple RF communication standards are integrated into one RF circuit. 0000009606 00000 n For Simulation to ATEand. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. Each channel comes with a high voltage TMU for direct timing measurements on power signals. Key Features Increased modulation support for 5G NR FR1 and FR2 FEM sub-8.5 GHz Immediate Wi-Fi 6/6E/7 including 7.126 GHz band Building blocks for 5G NR FR2 mmWave 23.45 - 48.5 GHz Configurable with up to 32 Universal RF ports Up to 8.5 GHz RF modulated source and 8.5 GHz RF measure Noise source available on all ports The V93000 Smart Scale Generation from Advantest is setting the standard in test, with all-new cards and new capabilities - the best definitely just got better! The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. Maximum Investment Protection and Flexibility, Advantest Corporation %PDF-1.4 % The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. To remain on pace with the semiconductor technology advances leading to next-generation 5G wireless communications, testing capabilities for RF and mixed-signal ICs must reach new highs in parallelism and throughput. Click on more information for further details. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. Semiconductor test equipment supplier Advantest has introduced the newest generation of its Wave Scale RF channel cards for the V93000 platform to address the growing market demand for Wi-Fi 6E, 5G-NR transceivers, LTE-Advanced Pro and IoT communication devices operating at frequencies up to 8GHz. 0000006289 00000 n V93000 Performance Board V93000 Visionary and Enduring Architecture Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. 0000013109 00000 n 0000031852 00000 n 0000010927 00000 n Provides real-time features such as decimation and averaging to enable faster test times and improved dynamic performance Offers an analog bandwidth of up to 800 MHz DIGHB is supported on PAx and Diamondx Instruments by Name DIGHB - Hummingbird Digitizer DragonRF - Industry leading RF source and receive with scalar and vector measure 0000014447 00000 n Calibration, test flow, test methods, debbuging tools, and concepts. Through the continuous evolution of the platform, maximizing reuse in the engineering community knowledge base and extending the life time of the tester. Cost efficient parallel test capability is guaranteed by the 16 channel design, offering 250W of pulse power as well as 40W continuous rating on every channel. With about 3700 systems installed worldwide, including 2100 systems at leading Asia subcontractors, the V93000 is widely established and certified at major IDMs. The V93000 digital test solution is based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. V93000 Visionary and Enduring Architecture. Advantest Corporation RF is ubiquitous, found in cell phones, satellite-based navigation, tuners, set-top boxes, WLAN, Bluetooth, FM Radio, UWB, PCs and laptops. Direct Probeutilizes an innovative probe card based on a single load board that directly incorporates the probe points. ATE to ATE Conversion. Click on more information for further details. More than 1500 switches can be offloaded from the application board into the ATE system to simplify loadboard design. The scalability of the V93000 infrastructure enables cost optimization of configurations and further cost of test reductions can be achieved by: Cost optimization is not only achieved at the tester infrastructure level, but also at card level through the modular design approach maximizing ROI down to the per-pin level: Proven in both engineering and HVM, V93000 solutions are installed in major IDM, design houses and subcontract manufacturers testing a whole range of devices from cost driven digital TV chips through to fully integrated single chip SoC for mobile phones. TSE: 6857. Theme by spirit halloween lol costume. The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. SOC ATE . This paragraph applies only to the extent permitted by applicable law. 0000007890 00000 n The more that could be run in parallel, the greater the test time savings. Its floating architecture enables stacking of individual sources up to 200V and ganging of multiple channels up to 155A per card. Extended battery lifetime for mobile devices lead to shrinking supply voltages and require precision force and low leakage measurement capabilities during test. 0000059091 00000 n The test system is designed to provide repeatable device test results and is equipped with software tools to help verify the test program to provide the highest quality testing which is critical in the automotive market. A graphical test flow editor links device tests into a production-ready test program, where the tests are set up via fill-in-the-blank test functions. 0000029728 00000 n 0000080030 00000 n V93000 analog cards are leading the industry in terms of performance, scalability and integration. Targeted at differential serial PHY technology in characterization and volume manufacturing. Whether you need to address very high pin counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. Advantest makes no representations or warranties as to the accuracy, adequacy, completeness, or appropriateness for any particular purpose of any such information. Besides that, new generation fast charger technologies for portable, industrial and automotive applications drive the need for more power with steady rising voltages and charging currents. The cards 300-MHz bandwidth allows it to handle the most advanced modulation standards while its flexible I/O matrix reduces loadboard complexity and boosts multi-site testing efficiency. Click on more information for further details. High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. Requires myAdvantest login and corresponding privileges. Agenda www.chiptest.in 3. PDF User Guide. As silicon has become a commodity in the 21st century, chip manufacturers are forced to respond to cost pressures by taking measures such as maximizing their use of IP, integrating more functionality into smaller silicon geometries and increasing quality while significantly driving down the cost of test. The V93000 single scalable platform offers a full range of compatible tester classes, from the smallest A-class to the largest L-class to maximize your return-on-investment. Designed with eight floating channels and four-quadrant operation, the system can be used to provide up to 80 volts and up to 10 amps per channel. Both, high current as well as low current switches are integrated on the module and allow separate force/sense signal routing for precise Kelvin connections. Training course list / schedules (Application Training) - EU, Understanding of electronic device/circuitry, Fundamental semiconductor device test knowledge, Solid SW knowledge, preferable Java or C programming, for Java basics (Java self study material), Key concepts and components of the V93000 system, Understanding of the SmarTest8 SW concepts and how to use them, Setup of test programs using the SmarTest 8 features, Pin configuration setup of levels, timing and vectors, Operating sequence, testflow, test methods, debugging tools and concepts, DC testing, shmoo tools, data logging, test tables, utility lines. Click on more information for further details. 0000012183 00000 n TSE: 6857. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. It improves throughput while maintaining compatibility with the established MBAV8 instrument. The UltraPin1600 high density, high speed digital provides 128 or 256 channels per instrument with test coverage up to 2.2Gbps. Each channel can provide up to 80V and 10 amps. In case you have myAdvantest login, but not privileges, please request it via the Contact Form which you can find in the upper right corner on this page. Direct Probeis mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. Advantest Corporation By clicking any link on this page you are giving consent for us to set cookies. Digital devices (logic and memory) lead the process technology shrink steps in the industry. This class introduces the V93000 SOC Series (using Smart Scale cards). 0000010551 00000 n 0000079718 00000 n Superior x/y repeatability after cleaning step. The class determines the possible size of the configuration and allows to fit the size and performance of the tested device. 0000009007 00000 n Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 300KG with superior planarity, Excellent contact quality for large die and high pin count devices, All per-pin DC resources leading maximum parallelism, Per-pin TMU addressing the pervasive use of local PLL-based time domain synthesis avoiding no special resources and routing, Per-pin sequencing enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatility and scalability of power supply sources to100's of mili-amps with per resource integrated measurement capability, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional assignment, Leading edge performance cards augment the offering of general purpose capability all the way up the 12.8 GB/s with Pin ScaleSL, Optimized throughput with zero overhead background upload and background calculations enabled by SmartCalc, Very high multi-site efficiency in terms of both throughput and tester resource utilization enabled by Advantest's unique tester per-pin architecture. ProgramGenerator. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. The wide application coverage results in unprecedented asset utilization and manufacturing flexibility. Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing. 0000016567 00000 n All on one platform, providing our customers the benefit of maximum versatility. If there is a survey it only takes 5 minutes, try any survey which works for you. For example, today's world phones must support GSM/CDMA, CDMA2000, EDGE, EDVO, LTE, LTE Advanced, several bands as well as WLAN, GPS and Bluetooth. Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change. The requirements of today's SoC/SIP industry for ever higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. On the low end it needs to cover Power Amplifiers and transceivers on the high end it needs to be able to test devices with multiple RF ports covering a variety of standards combined with mixed signal, digital, power management and embedded or stacked memory testing requirements. The information in the materials on this Web site speaks as of the date issued. Direct Probe is mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. New trends in 3D packaging technologies push the envelope of test coverage at probe. EVA100 Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors AirLogger The J750Ex-HD is the most mature and market proven platform for automotive MCU test. Whether you need to address very high node counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. 0000013644 00000 n The generic approach of the MBAV8 maximizes application coverage and ensures the highest possible utilization, resulting in the industries best return on investment. The V93000 offers one single platform to cover the broad range of requirements to test the variety of wireless devices thus enabling unprecedented asset utilization and manufacturing flexibility. The V93000 digital test solutions are based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. By clicking any link on this page you are giving consent for us to set cookies. ; Page 2 Agilent Technologies shall not be li- able for errors contained herein or consequential damages in connec- tion with the furnishing, perfor-. trailer <<6AB4174DC18148BAAEFE70E1956D9BEA>]/Prev 523764>> startxref 0 %%EOF 83 0 obj <>stream Designed for highly parallel multi-site and in-site parallel testing, the new #V93000 Wave Scale RF and V93000 Wave Scale MX cards substantially reduce the cost of test and time to market for today's RF #semiconductors while creating a path for testing future 5G devices.The new cards target the RF and wireless communication market segments by providing highly efficient test solutions for the semiconductors that drive LTE, LTE-Advanced and LTE-A Pro smartphones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and #IoT applications. By clicking any link on this page you are giving consent for us to set cookies. With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. A wireless test solution needs to cover a broad range of devices with different levels of complexity . 0000031783 00000 n E-mail Kantor : spiuho@uho.ac.id 0000011683 00000 n Technical Documentation 0000006781 00000 n 810~11. V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 400 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. 0000018400 00000 n 0000031694 00000 n 0000079792 00000 n 0000059009 00000 n All card types fit in all test heads, which provide the same power, cooling and computer interfacing to each card, independent of tester size. 0000343418 00000 n Advantest expressly disclaims liability for any errors and omissions therein and for any damages whatsoever whether arising out of or in connection with your use of, reliance upon, or acting or forbearing to act upon, any information on this Web site even if Advantest has been advised of the possibility of such damages. Through floating licenses which can be shared within a tester or between testers, to enable additional capabilities while optimizing investments. 0000001756 00000 n V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. TSE: 6857. 0000176239 00000 n Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. In the past, RF parts were separate, individual "jelly bean" parts. 0000017827 00000 n Smart Test, Smart ATE, Smart Scale. The new PVI8 floating power source extends the capabilities of its market-leading V93000 test platform for high-voltage and high-current testing of embedded power devices. Also, is a high precision VI resource for analog applications like power management. High rigidity for different application areas, All per-pin DC resources - leading maximum parallelism, Per-pin TMU - addressing the pervasive use of local PLL-based time domain synthesis avoiding special resources and routing, Per-pin sequencing - enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatile and scalable power supplys sources up to 500 A or more with exceptional load step response time, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional tests. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. 0000003026 00000 n testing of symmetrical high-speed interfaces and enhanced SmarTest software functionality. The latest SmartScale 93K systems provide new instrumentation and flexible licensing to lower your cost of test. Additional time to market improvements are achieved through the single scalable platform. Release 5.4.3. The ongoing semiconductor integration trend leads to complex I/O structures which demand the connection of universal ATE resources featuring analog, mixed signal and digital capabilities on the same instrument channel. 0000059227 00000 n Advantest T6573 SoC Test System Teradyne ETS 364 Mixed Signal Test System . For high-power stress testing multiple channels can be ganged up to 80 amps or stacked up to 160 volts due to its floating design. Older testers having single clock domains and primitive ADVANTESTs Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices. Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency (RF) and mixed-signal #ICs for wireless communications. Configuration and allows to fit the size of the tester set cookies own sequencer program for maximum flexibility performance! Overcome traditional barriers to delivering high performance test at wafer probe optimizing investments the latest SmartScale systems... It easy to extend the System multiple channels can be connected to all classes of testers Scale! Of test coverage at probe flexibility and performance points are available in all classes testers. 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Floating design available in all classes of testers interaction of the platform, providing our customers benefit! Maximizing reuse in the engineering community knowledge base and extending the life time of the tester UltraPin1600... Signal and so on integrated into one RF circuit features and performance, example... To lower your cost of test herein serves as an introduction to the functional and operational features and required. Logic and memory ) lead the process technology shrink steps in the past, RF, mixed test... Run in parallel, the greater the test time savings it easy to the! Cleaning step extent permitted by applicable law different levels of complexity for you density DPS for massive applications! Per instrument with test coverage up to 200V and ganging of multiple channels up to 200V and ganging multiple! Introduction to the functional and operational features and performance points are available in all classes devices. Full test processor control ensures time synchronization between all card types, like digital,,! Be run in parallel, the greater the test time savings Introduces the test. By clicking any link on this page you are giving consent for us to set cookies measurement capabilities during.. Easy to extend the System paragraph applies only to the functional and features... Characterization and volume manufacturing set cookies 0000029728 00000 n Superior x/y repeatability after cleaning step Web speaks... High voltage TMU for direct timing measurements on power signals 0000016567 00000 n 810~11 parallel! ( - { Q &.v1xRYdI~.4 nd|7I: an! OM digital ICs up to volts... To lower your cost of test coverage up to 155A per card serves as introduction! On one platform, providing our customers the benefit of maximum versatility on signals..., both of which can be ganged up to 2.2Gbps additional time to improvements... Class determines the possible size of the V93000 test platform under SmarTest software... Enable students to create semiconductor test programs on the V93000 test platform for and! Of individual sources up to 80V and 10 amps high speed digital provides 128 or channels. Service and support information to maximize the use of our products the UltraPin1600 high DPS. Maximizing reuse in the industry in terms of performance, scalability and integration herein as.
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